![]() ![]() ![]() Composition Toppan Best-set Premedia Ltd., Hong Kong Printing and Binding Cover Design Adam Design, Weinheim Printed in the Federal Republic of Germany Printed on acid-free paper ISBN: 978-7-9Ĭontents Preface to the First Edition XVII Preface to the Second Edition XIX List of Contributors XXI used in this book, even when not specifically marked as such, are not to be considered unprotected by law. No part of this book may be reproduced in any form – by photoprinting, microfilm, or any other means – nor transmitted or translated into a machine language without written permission from the publishers. 12, 69469 Weinheim, Germany All rights reserved (including those of translation into other languages). Bibliographic information published by the Deutsche Nationalbibliothek The Deutsche Nationalbibliothek lists this publication in the Deutsche Nationalbibliografie detailed bibliographic data are available on the Internet at. Library of Congress Card No.: applied for British Library Cataloguing-in-Publication Data A catalogue record for this book is available from the British Library. Readers are advised to keep in mind that statements, data, illustrations, procedural details or other items may inadvertently be inaccurate. Nevertheless, authors, editors, and publisher do not warrant the information contained in these books, including this book, to be free of errors. Henning Bubert Augsburger Weg 51 59439 Holzwickede GermanyĪll books published by Wiley-VCH are carefully produced. Gernot Friedbacher Institute of Chemical Technology and Analytics Getreidemarkt 9 /164 1060 Vienna Austria Dr. Second, Completely Revised and Enlarged Edition Surface and Thin Film Analysis A Compendium of Principles, Instrumentation, and Applications Optics and Spectroscopy at Surfaces and Interfaces 2005 ISBN: 978-0-2Įdited by Gernot Friedbacher and Henning Bubert ![]() Thin Film Analysis by X-Ray Scattering 2006 ISBN: 978-2-4 X-Rays in Nanoscience Spectroscopy, Spectromicroscopy, and Scattering Techniques 2010 ISBN: 978-8-6 F., Wolstenholme, J.Īn Introduction to SIMS for Surface and Thin Film Analysis 2011 ISBN: 978-2-6 Edited by Gernot Friedbacher and Henning Bubert Surface and Thin Film Analysis ![]()
0 Comments
Leave a Reply. |
AuthorWrite something about yourself. No need to be fancy, just an overview. ArchivesCategories |